pco.edge 5.5 CLHS
PART/ 85108072647

pco.edge 5.5 DS CLHS sCMOS Camera

The pco.edge 5.5 DS CLHS camera features a high resolution of 5.5 MPixel and operates in 16-bit mode for precise imaging. Its double shutter mode enables an interframing time of just 100 ns, ideal for capturing fast dynamic processes. This advanced camera is perfect for applications requiring exceptional detail and speed, such as in Particle Image Velocimetry (PIV) applications.

Sensor Technology sCMOS FSI
Resolution (H x V) 2560 x 2160
Pixel Size (H x V) 6.5 x 6.5
Sensor Diagonal 21.8 mm
Peak Quantum Efficiency 60.0 %
Peak Quantum Efficiency Wavelength 600.0 nm
Global Shutter true
Rolling Shutter true
Global Reset true
Operational Modes Slow Scan: Rolling Shutter
Slow Scan: Global Reset
Fast Scan: Rolling Shutter
Fast Scan: Global Reset
Fast Scan: Global Shutter
Fast Scan: Double Shutter
Readout Noise RMS 1.4 e-
1.4 e-
1.5 e-
1.5 e-
2.5 e-
2.5 e-
Readout Noise Median 1.0 e-
1.0 e-
1.1 e-
1.1 e-
2.2 e-
2.2 e-
Fullwell Capacity 30000 e-
Dynamic Range 30000:1
30000:1
27000:1
27000:1
13500:1
13500:1
Dynamic Range (log) 90.0 dB
90.0 dB
89.0 dB
89.0 dB
83.0 dB
83.0 dB
Dark Current 0.6 e-/s
0.6 e-/s
0.6 e-/s
0.6 e-/s
0.9 e-/s
0.9 e-/s
Sensor Temperature (Dark Current Reference) 7.0 °C
Frame rate (Full Sensor) 33.0 fps
33.0 fps
100.0 fps
100.0 fps
50.0 fps
25.0 fps
Dynamic Range A/D Converter 16 bit
Thermo Electric Cooling true
Forced Air true
Liquid Cooling false
Data Interface Camera Link HS FOL
Included Lens Mount C-Mount
F-Mount
Width 70.0 mm
Length 123.0 mm
Weight (kg) 0.8
Height 76.0 mm
Part Number 85108072647
  • Short interframing time of 100 ns in double shutter mode
  • Fiber-optic CLHS FOL interface for high-resolution streaming
  • Resolution of 2560 x 2160 pixels
  • Adapted for PIV applications
  • Tunnel inspection
  • Particle tracking velocimetry (PTV)
  • PIV application
  • Structured illumination microscopy (SIM)
  • High-speed bright-field ratio imaging
  • High throughput screening
  • High content screening
  • Biochip reading
  • Total internal reflection microscopy (TITF)
  • Spinning disk confocal microscopy
  • 3D metrology
  • Ophthalmology
  • Photovoltaic inspection
  • Industrial quality inspection
  • Wafer inspection
  • Lucky astronomy
  • Disaster recovery
Sensor Technology sCMOS FSI
Resolution (H x V) 2560 x 2160
Pixel Size (H x V) 6.5 x 6.5
Sensor Diagonal 21.8 mm
Peak Quantum Efficiency 60.0 %
Peak Quantum Efficiency Wavelength 600.0 nm
Global Shutter true
Rolling Shutter true
Global Reset true
Operational Modes Slow Scan: Rolling Shutter
Slow Scan: Global Reset
Fast Scan: Rolling Shutter
Fast Scan: Global Reset
Fast Scan: Global Shutter
Fast Scan: Double Shutter
Readout Noise RMS 1.4 e-
1.4 e-
1.5 e-
1.5 e-
2.5 e-
2.5 e-
Readout Noise Median 1.0 e-
1.0 e-
1.1 e-
1.1 e-
2.2 e-
2.2 e-
Fullwell Capacity 30000 e-
Dynamic Range 30000:1
30000:1
27000:1
27000:1
13500:1
13500:1
Dynamic Range (log) 90.0 dB
90.0 dB
89.0 dB
89.0 dB
83.0 dB
83.0 dB
Dark Current 0.6 e-/s
0.6 e-/s
0.6 e-/s
0.6 e-/s
0.9 e-/s
0.9 e-/s
Sensor Temperature (Dark Current Reference) 7.0 °C
Frame rate (Full Sensor) 33.0 fps
33.0 fps
100.0 fps
100.0 fps
50.0 fps
25.0 fps
Dynamic Range A/D Converter 16 bit
Thermo Electric Cooling true
Forced Air true
Liquid Cooling false
Data Interface Camera Link HS FOL
Included Lens Mount C-Mount
F-Mount
Width 70.0 mm
Length 123.0 mm
Weight (kg) 0.8
Height 76.0 mm
Part Number 85108072647
  • Short interframing time of 100 ns in double shutter mode
  • Fiber-optic CLHS FOL interface for high-resolution streaming
  • Resolution of 2560 x 2160 pixels
  • Adapted for PIV applications
  • Tunnel inspection
  • Particle tracking velocimetry (PTV)
  • PIV application
  • Structured illumination microscopy (SIM)
  • High-speed bright-field ratio imaging
  • High throughput screening
  • High content screening
  • Biochip reading
  • Total internal reflection microscopy (TITF)
  • Spinning disk confocal microscopy
  • 3D metrology
  • Ophthalmology
  • Photovoltaic inspection
  • Industrial quality inspection
  • Wafer inspection
  • Lucky astronomy
  • Disaster recovery
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