PART/ 85108072647
pco.edge 5.5 DS CLHS sCMOS Camera
The pco.edge 5.5 DS CLHS camera features a high resolution of 5.5 MPixel and operates in 16-bit mode for precise imaging. Its double shutter mode enables an interframing time of just 100 ns, ideal for capturing fast dynamic processes. This advanced camera is perfect for applications requiring exceptional detail and speed, such as in Particle Image Velocimetry (PIV) applications.
| Sensor Technology | sCMOS FSI |
| Resolution (H x V) | 2560 x 2160 |
| Pixel Size (H x V) | 6.5 x 6.5 |
| Sensor Diagonal | 21.8 mm |
| Peak Quantum Efficiency | 60.0 % |
| Peak Quantum Efficiency Wavelength | 600.0 nm |
| Global Shutter | true |
| Rolling Shutter | true |
| Global Reset | true |
| Operational Modes |
Slow Scan: Rolling Shutter Slow Scan: Global Reset Fast Scan: Rolling Shutter Fast Scan: Global Reset Fast Scan: Global Shutter Fast Scan: Double Shutter |
| Readout Noise RMS |
1.4 e- 1.4 e- 1.5 e- 1.5 e- 2.5 e- 2.5 e- |
| Readout Noise Median |
1.0 e- 1.0 e- 1.1 e- 1.1 e- 2.2 e- 2.2 e- |
| Fullwell Capacity | 30000 e- |
| Dynamic Range |
30000:1 30000:1 27000:1 27000:1 13500:1 13500:1 |
| Dynamic Range (log) |
90.0 dB 90.0 dB 89.0 dB 89.0 dB 83.0 dB 83.0 dB |
| Dark Current |
0.6 e-/s 0.6 e-/s 0.6 e-/s 0.6 e-/s 0.9 e-/s 0.9 e-/s |
| Sensor Temperature (Dark Current Reference) | 7.0 °C |
| Frame rate (Full Sensor) |
33.0 fps 33.0 fps 100.0 fps 100.0 fps 50.0 fps 25.0 fps |
| Dynamic Range A/D Converter | 16 bit |
| Thermo Electric Cooling | true |
| Forced Air | true |
| Liquid Cooling | false |
| Data Interface | Camera Link HS FOL |
| Included Lens Mount |
C-Mount F-Mount |
| Width | 70.0 mm |
| Length | 123.0 mm |
| Weight (kg) | 0.8 |
| Height | 76.0 mm |
| Part Number | 85108072647 |
- Short interframing time of 100 ns in double shutter mode
- Fiber-optic CLHS FOL interface for high-resolution streaming
- Resolution of 2560 x 2160 pixels
- Adapted for PIV applications
- Tunnel inspection
- Particle tracking velocimetry (PTV)
- PIV application
- Structured illumination microscopy (SIM)
- High-speed bright-field ratio imaging
- High throughput screening
- High content screening
- Biochip reading
- Total internal reflection microscopy (TITF)
- Spinning disk confocal microscopy
- 3D metrology
- Ophthalmology
- Photovoltaic inspection
- Industrial quality inspection
- Wafer inspection
- Lucky astronomy
- Disaster recovery




| Sensor Technology | sCMOS FSI |
| Resolution (H x V) | 2560 x 2160 |
| Pixel Size (H x V) | 6.5 x 6.5 |
| Sensor Diagonal | 21.8 mm |
| Peak Quantum Efficiency | 60.0 % |
| Peak Quantum Efficiency Wavelength | 600.0 nm |
| Global Shutter | true |
| Rolling Shutter | true |
| Global Reset | true |
| Operational Modes |
Slow Scan: Rolling Shutter Slow Scan: Global Reset Fast Scan: Rolling Shutter Fast Scan: Global Reset Fast Scan: Global Shutter Fast Scan: Double Shutter |
| Readout Noise RMS |
1.4 e- 1.4 e- 1.5 e- 1.5 e- 2.5 e- 2.5 e- |
| Readout Noise Median |
1.0 e- 1.0 e- 1.1 e- 1.1 e- 2.2 e- 2.2 e- |
| Fullwell Capacity | 30000 e- |
| Dynamic Range |
30000:1 30000:1 27000:1 27000:1 13500:1 13500:1 |
| Dynamic Range (log) |
90.0 dB 90.0 dB 89.0 dB 89.0 dB 83.0 dB 83.0 dB |
| Dark Current |
0.6 e-/s 0.6 e-/s 0.6 e-/s 0.6 e-/s 0.9 e-/s 0.9 e-/s |
| Sensor Temperature (Dark Current Reference) | 7.0 °C |
| Frame rate (Full Sensor) |
33.0 fps 33.0 fps 100.0 fps 100.0 fps 50.0 fps 25.0 fps |
| Dynamic Range A/D Converter | 16 bit |
| Thermo Electric Cooling | true |
| Forced Air | true |
| Liquid Cooling | false |
| Data Interface | Camera Link HS FOL |
| Included Lens Mount |
C-Mount F-Mount |
| Width | 70.0 mm |
| Length | 123.0 mm |
| Weight (kg) | 0.8 |
| Height | 76.0 mm |
| Part Number | 85108072647 |
- Short interframing time of 100 ns in double shutter mode
- Fiber-optic CLHS FOL interface for high-resolution streaming
- Resolution of 2560 x 2160 pixels
- Adapted for PIV applications
- Tunnel inspection
- Particle tracking velocimetry (PTV)
- PIV application
- Structured illumination microscopy (SIM)
- High-speed bright-field ratio imaging
- High throughput screening
- High content screening
- Biochip reading
- Total internal reflection microscopy (TITF)
- Spinning disk confocal microscopy
- 3D metrology
- Ophthalmology
- Photovoltaic inspection
- Industrial quality inspection
- Wafer inspection
- Lucky astronomy
- Disaster recovery




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