pco.horizon 9.1 bi TDI CLHS Line Scan Camera
The pco.horizon 9.1 bi TDI CLHS Line Scan Camera features a 9K resolution and 256 TDI stages for ultra-precise inspection applications requiring exceptional sensitivity, resolution, and image stability. Equipped with a temperature-stabilized, back-illuminated CMOS sensor and dual photosensitive bands, it delivers exceptional image quality and sensitivity at line rates up to 600 kHz. The Camera Link HS (CLHS) interface enables fast, reliable data transmission with simplified cabling, ensuring seamless integration into high-performance vision systems. Its robust design, flexible thermal management, and easy integration make it ideal for demanding tasks in semiconductor inspection, print verification, web inspection, and medical imaging.
With a sensor pixel size of 5 µm, resolution of 9072 pixels and 256 TDI stages, the pco.horizon 9.1 bi TDI sets a new standard for speed, reliability, and image stability in high-speed precision environments. It features a back-illuminated CMOS sensor and dual photosensitive bands, delivering enhanced light sensitivity and signal-to-noise performance. The camera’s temperature-stabilized sensor ensures reliable and consistent image quality over time, even in thermally challenging environments.
| Interface | CLHS FOL |
| Sensor technology | Back illuminated TDI CMOS |
| Resolution | 2 photosensitive bands |
| Sensor diagonal | 45.36 mm |
| Pixel size | 5 μm x 5 μm |
| Maximum line rate | 600 kHz |
| Peak QE | Standard: 82% @ 550 nm |
| Shutter type | Global Shutter |
| Sensor cooling | Forced air or liquid cooling |
- Digital pathology
- Flat panel inspection
- Fluorescence imaging
- Gene sequencing
- Industrial quality inspection
- Machine vision
- Material testing
- Optical inspection
- PCB and electronics inspection
- Wafer inspection
| Interface | CLHS FOL |
| Sensor technology | Back illuminated TDI CMOS |
| Resolution | 2 photosensitive bands |
| Sensor diagonal | 45.36 mm |
| Pixel size | 5 μm x 5 μm |
| Maximum line rate | 600 kHz |
| Peak QE | Standard: 82% @ 550 nm |
| Shutter type | Global Shutter |
| Sensor cooling | Forced air or liquid cooling |
- Digital pathology
- Flat panel inspection
- Fluorescence imaging
- Gene sequencing
- Industrial quality inspection
- Machine vision
- Material testing
- Optical inspection
- PCB and electronics inspection
- Wafer inspection
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