pco.edge 4.2 CLHS sCMOS Camera
The pco.edge 4.2 is a high resolution, cooled sCMOS camera that operates with streaming via a 10G FOL (Camera Link HS) to allow direct processing of large data transfers through its high-performance data interface making it easy to securely bridge distances of up to 10 km. The pco.edge 4.2 is equipped with a low noise 16-bit scientific CMOS sensor to ensure crisp images and precise measurements. The pco.edge 4.2 sCMOS camera also comes with an upgrade option to include a water cooling system.
| Sensor Technology | sCMOS FSI |
| Resolution (H x V) | 2048 x 2048 |
| Pixel Size (H x V) | 6.5 x 6.5 |
| Sensor Diagonal | 18.8 mm |
| Peak Quantum Efficiency | 80.0 % |
| Peak Quantum Efficiency Wavelength | 580.0 nm |
| Global Shutter | false |
| Rolling Shutter | true |
| Global Reset | false |
| Operational Modes |
Slow Scan: Rolling Shutter with Selectable Readout Direction Fast Scan: Rolling Shutter with Selectable Readout Direction |
| Readout Noise RMS |
1.5 e- 1.6 e- |
| Readout Noise Median |
0.8 e- 0.9 e- |
| Fullwell Capacity | 30000 e- |
| Dynamic Range |
37500:1 33500:1 |
| Dynamic Range (log) |
91.0 dB 90.0 dB |
| Dark Current | 0.6 e-/s |
| Sensor Temperature (Dark Current Reference) | 7.0 °C |
| Frame rate (Full Sensor) |
35.0 fps 100.0 fps |
| Dynamic Range A/D Converter | 16 bit |
| Thermo Electric Cooling | true |
| Forced Air | true |
| Liquid Cooling | false |
| Working Temperature Image Sensor | +7 °C stabilized (up to +27 °C ambient temperature) |
| Data Interface | Camera Link HS FOL |
| Included Lens Mount |
C-Mount F-Mount |
| Width | 70.0 mm |
| Length | 123.0 mm |
| Weight (kg) | 0.8 |
| Height | 76.0 mm |
| Part Number | 85108072309 |
- Bright-field microscopy
- Fluorescence microscopy
- Digital pathology
- Single molecule localization microscopy (SMLM) – PALM, STORM, dSTORM, GSDIM
- Lightsheet fluorescence microscopy (LSFM)
- Structured illumination microscopy (SIM)
- Calcium imaging
- Förster resonance energy transfer (FRET)
- Fluorescence recovery after photobleaching (FRAP)
- High-speed bright-field ratio imaging
- High throughput screening | high content screening
- Biochip reading
- Total internal reflection microscopy (TITF)
- Spinning disk confocal microscopy
- 3D metrology
- Ophthalmology
- Photovoltaic inspection
- Industrial quality inspection
- Wafer inspection
- Image intensifier imaging
- Lucky astronomy
- Particle tracking velocimetry (PTV)


| Sensor Technology | sCMOS FSI |
| Resolution (H x V) | 2048 x 2048 |
| Pixel Size (H x V) | 6.5 x 6.5 |
| Sensor Diagonal | 18.8 mm |
| Peak Quantum Efficiency | 80.0 % |
| Peak Quantum Efficiency Wavelength | 580.0 nm |
| Global Shutter | false |
| Rolling Shutter | true |
| Global Reset | false |
| Operational Modes |
Slow Scan: Rolling Shutter with Selectable Readout Direction Fast Scan: Rolling Shutter with Selectable Readout Direction |
| Readout Noise RMS |
1.5 e- 1.6 e- |
| Readout Noise Median |
0.8 e- 0.9 e- |
| Fullwell Capacity | 30000 e- |
| Dynamic Range |
37500:1 33500:1 |
| Dynamic Range (log) |
91.0 dB 90.0 dB |
| Dark Current | 0.6 e-/s |
| Sensor Temperature (Dark Current Reference) | 7.0 °C |
| Frame rate (Full Sensor) |
35.0 fps 100.0 fps |
| Dynamic Range A/D Converter | 16 bit |
| Thermo Electric Cooling | true |
| Forced Air | true |
| Liquid Cooling | false |
| Working Temperature Image Sensor | +7 °C stabilized (up to +27 °C ambient temperature) |
| Data Interface | Camera Link HS FOL |
| Included Lens Mount |
C-Mount F-Mount |
| Width | 70.0 mm |
| Length | 123.0 mm |
| Weight (kg) | 0.8 |
| Height | 76.0 mm |
| Part Number | 85108072309 |
- Bright-field microscopy
- Fluorescence microscopy
- Digital pathology
- Single molecule localization microscopy (SMLM) – PALM, STORM, dSTORM, GSDIM
- Lightsheet fluorescence microscopy (LSFM)
- Structured illumination microscopy (SIM)
- Calcium imaging
- Förster resonance energy transfer (FRET)
- Fluorescence recovery after photobleaching (FRAP)
- High-speed bright-field ratio imaging
- High throughput screening | high content screening
- Biochip reading
- Total internal reflection microscopy (TITF)
- Spinning disk confocal microscopy
- 3D metrology
- Ophthalmology
- Photovoltaic inspection
- Industrial quality inspection
- Wafer inspection
- Image intensifier imaging
- Lucky astronomy
- Particle tracking velocimetry (PTV)


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