A-Zoom Probing Microscopes

Excelitas offers the A-Zoomµ Micro^®, Single-Objective, Analytical Probing Microscope for value-added wafer imaging. Its compact, single-objective design eliminates cumbersome nose-turret manipulation improving wafer probing throughput.  Designed for streamlined operation and compact integration onto a multitude of probing stations, the A-Zoomµ Micro offers a high-value solution for circuit board, semiconductor and flat-panel display probing without sacrificing features, function or performance.